Multilayer construction
US8846518B2 · kind B2 · utility
0Cited by
7References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2011 |
| Grant date | Sep 30, 2014 |
| Priority date | — |
| Expiry date | Jun 1, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/347
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A multilayer construction is disclosed. The multilayer construction includes a -II-VI semiconductor layer (110)x and a Si3N4 layer (120) disposed directly on the II-VI semiconductor layer. To improve the adhesion of the Si3N4 layer (120) a native oxide on the II-VI semiconductor layer is removed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.