Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing
US8847155B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 8, 2012 |
| Grant date | Sep 30, 2014 |
| Priority date | — |
| Expiry date | Dec 16, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A tandem TOF mass spectrometer includes a first TOF mass analyzer that generates an ion beam comprising a plurality of ions and that selects a group of precursor ions from the plurality of ions. A pulsed ion accelerator accelerates and refocuses the selected group of precursor ions. An ion fragmentation chamber is positioned to receive the selected group of precursor ions that is refocused by the pulsed ion accelerator. At least some of the selected group of precursor ions is fragmented in the ion fragmentation chamber. A second TOF mass analyzer receives the selected group of precursor ions and ion fragments thereof from the ion fragmentation chamber and separates the ion fragments and then detects a fragment ion mass spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.