Patent · US Active

Method and device for testing and calibrating electronic semiconductor components which convert sound into electrical signals

US8848931B2 · kind B2 · utility

1Cited by

5References

9Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Max Schaule · Mindelheim, DE
Arnfried Kiermeier · Groton, US
Stefan Binder · Rosenheim, DE

Key dates

Filing date	Mar 12, 2009
Grant date	Sep 30, 2014
Priority date	—
Expiry date	Jan 4, 2031

Classification

Technology area (CPC H)Electricity
CPC primaryH04R19/005
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.