Patent · US Active

Test fixture for strip samples

US8850898B2 · kind B2 · utility

10Cited by
12References
37Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 6, 2012
Grant dateOct 7, 2014
Priority date
Expiry dateOct 21, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0476
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test fixture for applying a prescribed displacement to a material includes a first and a second portion, a first and a second adjustable pin, and an actuator. The first portion includes a first pin that to engages the material at a first location on the material. A second pin is engages the material at a second location on the material. A third pin engages the material at a third location on the material. The first adjustable pin holds the material against the second pin at the second location. The second adjustable pin holds the material against the third pin at the third location. The actuator is adapted to configure a relative position between the first pin and the second and third pins.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.