Method and device for frequency response measurement

US8854030B2 · kind B2 · utility

Assignees

• Tallinn University of Technology · EE
• OÜ Eliko Tehnoloogia Arenduskeskus · EE

Inventors

• Olev Märtens · Tallinn, EE
• Mart Minn · Tallinn, EE
• Raul Land · Tallinn, EE
• Paul Annus · Tallinn, EE
• Tõnis Saar · Tallinn, EE
• Marko Reidla · Püssi, EE

Key dates

• Filing date: Jul 7, 2011
• Grant date: Oct 7, 2014
• Expiry date: Oct 19, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/3163
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method is provided for measuring a frequency response of an object, the method involving: generating an excitation signal having relatively fast changing frequency, defined by a time-domain function; generating at least one reference signal, having a waveform corresponding to the excitation signal; introducing the excitation signal into the object, receiving a response signal from the object; analyzing said response signal in a signal analyzer by correlating the response signal with at least one reference signal during a relatively short sliding time-domain window.