Patent · US Active

Alignment method for assembling substrates in different spaces without fiducial mark and its system

US8854450B2 · kind B2 · utility

0Cited by
4References
7Claims
0Family size

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Key dates

Filing dateJan 17, 2012
Grant dateOct 7, 2014
Priority date
Expiry dateFeb 21, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/681
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

An alignment method for assembling substrates in different spaces without fiducial mark and its system are provided, and the alignment method has steps of: pre-defining partially standard character regions of two substrates; capturing at least two partially actual images of two substrates in different waiting spaces, respectively; comparing to obtain at least two partially actual character regions of the two substrates, respectively; building actual coordinate systems of the two substrates, respectively; comparing the actual coordinate systems of the two substrates with each other to obtain a set of offset values; moving the two substrates from the different waiting spaces to an alignment-and-installation space based on the set of offset values and a predetermined movement value, respectively; and stacking the two substrates with each other to finish the alignment and installation in the alignment-and-installation space.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.