Systems and methods for measuring a profile characteristic of a glass sample
US8854623B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2013 |
| Grant date | Oct 7, 2014 |
| Priority date | — |
| Expiry date | Oct 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/412
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for measuring a profile of a glass sample (300) are disclosed. The method includes scanning a polarization-switched light beam (112PS) through the glass sample and a reference block (320) for different depths into the glass sample to define a transmitted polarization-switched light beam. The method also includes measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal (SR), and detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal (SD). The method further includes dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal (SN). Processing the normalized polarization-switched detector signal determines the profile characteristic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.