Methods and systems for inspecting a workpiece
US8855404B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 2012 |
| Grant date | Oct 7, 2014 |
| Priority date | — |
| Expiry date | Apr 24, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for inspecting a workpiece are provided. The method includes storing model data associated with the workpiece in an inspection system, determining a relative position of a depth sensing device relative to the workpiece, and calibrating a pose view for the inspection system relative to the model based on the position of the depth sensing device relative to the workpiece. The method further includes measuring actual depth distance data of at least one pixel of the depth sensing device relative to the workpiece and determining, based on the actual depth distance data, if the workpiece satisfies predetermined inspection criteria.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.