Dynamic graduated memory device protection in redundant array of independent memory (RAIM) systems
US8856620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2013 |
| Grant date | Oct 7, 2014 |
| Priority date | — |
| Expiry date | Dec 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2211/109
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Dynamic graduated memory device protection in redundant array of independent memory (RAIM) systems that include a plurality of memory devices is provided. A first severity level of a first failing memory device in the plurality of memory devices is determined. The first failing memory device is associated with an identifier used to communicate a location of the first failing memory device to an error correction code (ECC). A second severity level of a second failing memory device in the plurality of memory devices is determined. It is determined that the second severity level is higher than the first severity level. The identifier from the first failing memory device is removed based on determining that the second severity level is higher than the first severity level. The identifier is applied to the second failing memory device based on determining that the second severity level is higher than the first severity level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.