Patent · US Active

Alignment system and method for operating the same

US8860799B2 · kind B2 · utility

0Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 2011
Grant dateOct 14, 2014
Priority date
Expiry dateApr 7, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/62
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An alignment system includes a stage configured to retain an object, an image-capturing device configured to capture the image of the field of view of the microscope, and a processing module configured to generate a virtual mask and superimpose the virtual mask with the image of the object. In one embodiment of the present invention, a method for operating a virtual mask system includes the steps of generating a virtual mask, placing a first object on a stage, capturing at least one image of the first object, and superimposing the virtual mask with the image of the first object by adjusting a position or an inclined angle of the stage or adjusting a capturing position of an image-capturing device by considering at least the virtual mask and the image of the first object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.