System and method for measuring capacitance
US8866499B2 · kind B2 · utility
1Cited by
3References
26Claims
0Family size
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Key dates
| Filing date | Aug 27, 2009 |
| Grant date | Oct 21, 2014 |
| Priority date | — |
| Expiry date | Apr 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for testing capacitance of a load circuit connected to an output pin of a driving circuit In one embodiment, the method may comprise driving a voltage at the output pin to a first voltage; a predetermined current to the output pin; comparing the voltage at the output pin to a reference voltage; and when the voltage at the output pin matches the reference voltage, generating an estimate of capacitance present at the output pin based on a number of clock cycles occurring between an onset of a timed voltage change period and a time at which the voltage at the output pin matches the reference voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.