Chip-scale optomechanical gravimeter
US8867026B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2012 |
| Grant date | Oct 21, 2014 |
| Priority date | — |
| Expiry date | Nov 25, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V7/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An method and apparatus for measuring gravitational force are described where at least one first radiation can be provided to at least one optomechanical oscillator, the at least one optomechanical oscillator being structured to deform under the gravitational force to cause a shift in resonance associated with the at least one optomechanical oscillator. In addition, at least one second radiation is received from the at least one optomechanical oscillator, wherein the at least one second radiation is associated with the shift in the resonance, and the shift in the resonance can be determined based on the first and second radiations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.