Patent · US Active

Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source

US8867704B2 · kind B2 · utility

1Cited by

7References

14Claims

0Family size

Assignee

BRUKER AXS GmbH · DE

Inventors

Rolf Schipper · Karlsruhe, DE
Joachim Lange · Hagenbach, DE

Key dates

Filing date	Sep 6, 2011
Grant date	Oct 21, 2014
Priority date	—
Expiry date	Oct 8, 2032

Classification

Technology area (CPC H)Electricity
CPC primaryH01J2235/081
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.