Method for fast, robust, multi-dimensional pattern recognition
US8867847B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2012 |
| Grant date | Oct 21, 2014 |
| Priority date | — |
| Expiry date | Oct 19, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/752
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.