Patent · US Active

System-level testcase generation

US8868976B2 · kind B2 · utility

4Cited by

16References

25Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Shimon Ben-Yehuda · Nes Ziona, IL
Shady Copty · Nazareth, IL
Alex Goryachev · Haifa, IL
John D. Jabusch · Endwell, US
Ronny Morad · Haifa, IL

Key dates

Filing date	Nov 4, 2010
Grant date	Oct 21, 2014
Priority date	—
Expiry date	Sep 10, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3684
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system-level testcase may be generated by performing system-level generation tasks by a system-level generator to produce an abstract testcase. Based upon the abstract testcase, one or more unit-level generators may generate the testcase. The testcase may be utilized in simulation of operation of a system-under-test (SUT). The testcase may be utilized for verification of the SUT. The SUT may comprise a plurality of units. The unit-level generator may be associated with units of the SUT and perform generation tasks associated with pertinent units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.