Semiconductor device and test apparatus including the same
US8872531B2 · kind B2 · utility
3Cited by
9References
17Claims
0Family size
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Key dates
| Filing date | Mar 16, 2011 |
| Grant date | Oct 28, 2014 |
| Priority date | — |
| Expiry date | May 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56012
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal and converting the serial command into a parallel command, a command decoder receiving the parallel command and generating a pattern sequence based on the parallel command, and a signal generator receiving the pattern sequence and generating operating signals synchronized with a second clock signal, wherein a frequency of the first clock signal is less than a frequency of the second clock signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.