Integrated circuit configuration system and method
US8872833B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2003 |
| Grant date | Oct 28, 2014 |
| Priority date | — |
| Expiry date | Apr 4, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors, including if the die has a defective component. An indication of the defective functional component identification is received. A determination is made if the defective functional component is one of a plurality of similar functional components that can provide the same functionality. The other similar components can be examined to determine if they are parallel components to the defective functional component. The defective functional component is disabled if it is one of the plurality of similar functional components and another component can handle the workflow that would otherwise be assigned to the defective component. Workflow is diverted from the disabled component to other similar functional components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.