Low coherence interferometric system for phase stepping shearography combined with 3D profilometry
US8873068B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 4, 2012 |
| Grant date | Oct 28, 2014 |
| Priority date | — |
| Expiry date | May 7, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer (1) is associated with the coherent or quasi-coherent projection device (2), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer (1) is associated with the recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.