Patent · US Active

Injected touch noise analysis

US8874396B1 · kind B1 · utility

25Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 2013
Grant dateOct 28, 2014
Priority date
Expiry dateDec 19, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K2217/960705
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A processing device configured to induce, during a listening scan of a sense array, an injected touch to produce similar data as would be present during a touch scan of the sense array with a conductive object at a known location on the sense array. The processing device is further configured to compute, using the data, an estimate of a noise metric based on the injected touch.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.