Built-in-self-test using embedded memory and processor in an application specific intergrated circuit
US8874983B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Oct 21, 2013 |
| Grant date | Oct 28, 2014 |
| Priority date | — |
| Expiry date | Oct 21, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/1816
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implemented using a few terminals of the ASIC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.