Measuring system for measuring absorption or scattering at different wavelengths
US8879063B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 22, 2011 |
| Grant date | Nov 4, 2014 |
| Priority date | — |
| Expiry date | Jul 24, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/31
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring system for measuring absorption or scattering of a medium at a plurality of different wavelengths, whereby the measurements for the different wavelengths are performable as simultaneously and as accurately as possible. The measuring system comprises: a measuring chamber; a transmitting unit, which sends light of its respective wavelength into the measuring chamber; a control, which operates each light source with a different time modulation of transmission intensity for each wavelength; a detector for measuring a total radiation intensity. The total radiation intensity corresponds to a superpositioning of each intensity portion striking the detector for each wavelength; and a signal processing system, which determines for each of the wavelengths the associated intensity portion based on the total radiation intensity measured by detector and the modulations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.