Patent · US Active

Analyzing structured light patterns

US8879827B2 · kind B2 · utility

2Cited by

0References

30Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Ziv Aviv · Bat Hefer, IL
David Stanhill · Hoshaya, IL
Ron Ferens · Ramat HaSharon, IL
Roi Ziss · Timrat, IL

Key dates

Filing date	Jun 29, 2012
Grant date	Nov 4, 2014
Priority date	—
Expiry date	Sep 13, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/10012
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Systems and methods may include utilizing a structured light pattern that may be, among other things, decoded in the three directions (e.g., vertical, horizontal, and diagonal). In one example, the method may include detecting a first feature of a target image in a return image, designating a feature type of the first feature, and an index with the letter, wherein the index is associated with the pattern slide. The method may also include calculating a horizontal position in the pattern slide of the first feature, calculating a vertical position in the pattern slide of the first feature, and calculating a depth of the first feature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.