Method for determining noise level
US8879863B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 7, 2013 |
| Grant date | Nov 4, 2014 |
| Priority date | — |
| Expiry date | May 7, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining noise levels in a subband of an image. The method comprises receiving the subband of the image, defining block regions in at least two space domains of the subband, for each defined block region, identifying first wavelet coefficients associated with coordinate values in the at least two space domains in the defined block region, computing a correlation matrix between identified wavelet coefficients to determine the correlation between first wavelet coefficients according to the at least one color domain, computing second wavelet coefficients, the computation of second wavelet coefficients being based on the correlation matrix and the first wavelet coefficients, computing at least one noise level, the noise level computation being based on at least one second wavelet coefficient and providing the at least one noise level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.