Calibration of sensors or measuring systems
US8880371B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2006 |
| Grant date | Nov 4, 2014 |
| Priority date | — |
| Expiry date | Jul 3, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/5438
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for adjusting a sensor, continuous sensor or automatic measuring system in an interstitium including the steps of adjusting the steepness of a measuring curve and a standard offset (standard axis intercept) prior to the use of the sensor, continuous sensor or measuring system, and adapting the offset by a point calibration by using a reference measure or value during the use. The present invention encompasses sensors, continuous sensors or automatic measuring systems calibrated or adjusted in accordance with the method, and in some embodiments, the offset adjusted prior to use is rectified according to the difference between a value determined by the sensor, continuous sensor or measuring system taking into account the standard steepness and the reference value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.