Relative time measurement system with nanosecond level accuracy
US8880372B2 · kind B2 · utility
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6References
23Claims
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Key dates
| Filing date | Apr 29, 2010 |
| Grant date | Nov 4, 2014 |
| Priority date | — |
| Expiry date | Jul 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG04G7/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for instantaneous and continuous nanosecond-level accuracy determination of a relative time offset between at least two non-collocated timing units, the system including at least two non-collocated timing units located at known positions, each timing unit comprising a frequency source and a collocated receiver, each frequency source being disciplined at a frequency domain using a time source to generate corrections of the relative frequency drift between the frequency source and the time source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.