Laser wavefront characterization
US8882274B1 · kind B1 · utility
1Cited by
3References
9Claims
0Family size
Inventors
Key dates
| Filing date | Aug 5, 2009 |
| Grant date | Nov 11, 2014 |
| Priority date | — |
| Expiry date | May 19, 2032 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/0008
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The device and method of the present invention are useful for determining the characteristics of an infrared wavefront. The present invention involves positioning a beam of light containing the infrared wavefront to be characterized onto a distorted grating, using the grating to produce a plurality of images, determining the infrared wavefront from the plurality of images and analyzing the infrared wavefront for features that characterize the infrared wavefront.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.