Eddy current array probe
US8884614B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2011 |
| Grant date | Nov 11, 2014 |
| Priority date | — |
| Expiry date | Aug 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.