Methods and system for electrostatic discharge protection of thin-film transistor backplane arrays
US8884641B2 · kind B2 · utility
1Cited by
6References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2010 |
| Grant date | Nov 11, 2014 |
| Priority date | — |
| Expiry date | Jul 5, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49169
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides devices and methods for testing the electrical performance of thin-film transistor backplane arrays and protecting thin-films during testing and handling.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.