Algorithm and a method for characterizing surfaces with fractal nature
US8884954B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2012 |
| Grant date | Nov 11, 2014 |
| Priority date | — |
| Expiry date | Apr 10, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer implemented method for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, is carried out by applying an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface. The invention provides a comprehensive approach for identifying all parameters of the W-M function including the phases and the density of the frequencies that must greater than 1. This enables the infinite-resolution analytical representation of any surface or density array through the W-M fractal function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.