Method for determining a condition indicator of an apparatus

US8886472B2 · kind B2 · utility

Assignee

• HACH LANGE GMBH · DE

Inventors

• Toon Streppel · Eerbeek, NL
• Torsten Seehaus · Goldkronach, DE
• Ulrich Schmitz · Hersbruck, DE
• Manfred Battefeld · Goldkronach, DE
• Frank Thomas · Solingen, DE
• Michael Kussmann · Goldkronach, DE
• Michael Haeck · Bensberg, DE

Key dates

• Filing date: Jun 18, 2013
• Grant date: Nov 11, 2014
• Expiry date: Jun 18, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N33/1886
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value is determined for each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values. An overall condition of the apparatus is determined using the condition indicator.