Generalized pattern recognition for fault diagnosis in machine condition monitoring

US8886574B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Chao Yuan · Plainsboro, US
• Amit Chakraborty · Plainsboro, US
• Leif Wiebking · Birkenfeld, DE
• Holger Hackstein · Dietzenbach, DE

Key dates

• Filing date: Jun 12, 2012
• Grant date: Nov 11, 2014
• Expiry date: Apr 20, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G06N20/00
• WIPO field: Control
• WIPO sector: Instruments

Abstract

A generalized pattern recognition is used to identify faults in machine condition monitoring. Pattern clusters are identified in operating data. A classifier is trained using the pattern clusters in addition to annotated training data. The operating data is also used to cluster the signals in the operating data into signal clusters. Monitored data samples are then classified by evaluating confidence vectors that include substitutions of signals contained in the training data by signals in the same signal clusters as the signals contained in the training data.