Systems and methods for performing measurements of one or more materials
US8889347B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2007 |
| Grant date | Nov 18, 2014 |
| Priority date | — |
| Expiry date | Jan 21, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/54333
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.