Patent · US Active

Display of a system state of a treatment device for microscopic samples

US8890709B2 · kind B2 · utility

1Cited by

2References

18Claims

0Family size

Assignee

Leica Instruments (Singapore) Pte. Ltd · SG

Inventors

Michael Thiel · Blankenloch, DE
Hermann Ulbrich · Annaberg-Buchholz, DE
Martin Zwicklowsky · Östringen, DE
Michael Erben · Philippsburg, DE
Michael Rapp · Seeheim-Jugenheim, DE
Stefan Kunkel · Aschaffenburg, DE
Udo Herrmann · Dormagen, DE

Key dates

Filing date	Nov 15, 2010
Grant date	Nov 18, 2014
Priority date	—
Expiry date	Aug 4, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01N2035/00891
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method of displaying a system state of an automatic treatment device, a corresponding display system which is configured for carrying out the method, and a treatment device equipped with the display system. At least one system parameter (121, 122, 123) is determined, the at least one determined (120) system parameter (121, 122, 123) is evaluated on the basis of evaluation criteria, the system state is evaluated on the basis of the at least one evaluated (130) system parameter (121, 122, 123), and the evaluated (140) system state is displayed by a traffic light function (175).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.