Optical scanning systems and methods for measuring a sealed container with a layer for reducing diffusive scattering
US8891086B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2010 |
| Grant date | Nov 18, 2014 |
| Priority date | — |
| Expiry date | Jun 27, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.