Patent · US Active

Method and apparatus for post-silicon testing

US8892386B2 · kind B2 · utility

3Cited by

4References

18Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Allon Adir · Kiryat Tivon, IL
Eyal Bin · Haifa, IL
Shady Copty · Nazareth, IL
Anatoly Koyfman · Kiryat Yam, IL
Shimon Landa · Kiryat Yam, IL
Amir Nahir · Tirat Karmel, IL
Vitali Sokhin · Haifa, IL
Elena Tsanko · Haifa, IL

Key dates

Filing date	Jul 10, 2011
Grant date	Nov 18, 2014
Priority date	—
Expiry date	May 21, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/263
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.