Measurement device and measurement method
US8892967B2 · kind B2 · utility
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3References
13Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 8, 2010 |
| Grant date | Nov 18, 2014 |
| Priority date | — |
| Expiry date | May 20, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A logic block group 120 having at least one set including a logic block having at least one logic circuit and a sequential circuit that inputs the output of the logic block is arranged in an irradiation region 110 of a high-energy particle irradiation device, and subjected to irradiation with high-energy particles. A control section 101 calculates the error rate of the logic circuit from the value obtained by subtracting the number of errors of the sequential circuit when the logic block of the logic block group 120 is bypassed, from the number of errors of the sequential circuit and the logic block of the logic block group 120.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.