Reliability in semiconductor device control
US8896364B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2011 |
| Grant date | Nov 25, 2014 |
| Priority date | — |
| Expiry date | Jun 27, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H7/268
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A gate control device for a semiconductor device includes at least one power supply module, at least one optical communication interface for receiving optical signals from two valve control units and converting them to electric signals for supply to a corresponding power supply module, where in normal operations mode one valve control unit is an active valve control unit and the other is a standby valve control unit, where the optical signal of an active unit energizes the gate control device and provides semiconductor device controlling data, a semiconductor device control module and a reliability control module that performs selection of active valve control unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.