Determining transmitter impairments using offset local oscillators
US8897349B2 · kind B2 · utility
1Cited by
31References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2014 |
| Grant date | Nov 25, 2014 |
| Priority date | — |
| Expiry date | Feb 5, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/08
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Systems and methods for measuring transmitter and/or receiver I/Q impairments are disclosed, including iterative methods for measuring transmitter I/Q impairments using shared local oscillators, iterative methods for measuring transmitter I/Q impairments using intentionally-offset local oscillators, and methods for measuring receiver I/Q impairments. Also disclosed are methods for computing I/Q impairments from a sampled complex signal, methods for computing DC properties of a signal path between the transmitter and receiver, and methods for transforming I/Q impairments through a linear system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.