Patent · US Active

Method and evaluation device for determining the position of a structure located in an object to be examined by means of X-ray computer tomography

US8897534B2 · kind B2 · utility

2Cited by

0References

20Claims

0Family size

Assignee

Mahle International GmbH · DE

Inventors

Steven Oeckl · Erlangen, DE
Werner Schon · Herzogenaurach, DE
Holger Schnell · Leinfelden, DE
Gustav Muller · Regensburg, DE
Ioannis Papadopoulos · Boxborough, US

Key dates

Filing date	Oct 31, 2011
Grant date	Nov 25, 2014
Priority date	—
Expiry date	Oct 31, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30164
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.