Method for correcting a defect pixel
US8897592B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2011 |
| Grant date | Nov 25, 2014 |
| Priority date | — |
| Expiry date | Mar 23, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20012
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for correcting a defect pixel includes extracting a pixel value of a central pixel, and pixel values of each of a plurality of neighboring pixels around the central pixel in an image sensor by using a color filter; calculating reference levels by multiplying each the pixel value of the plurality of neighboring pixels by a weight value; calculating a total number of cases where the pixel value of the central pixel is larger or smaller than the reference level as a first comparison value or second comparison value, respectively; determining the central pixel is a defect pixel where the first or second comparison value is larger than a first or second control register value, by comparing the comparison values with the control register values, respectively; and correcting the central pixel determined as the defect pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.