Patent · US Active

High performance compaction for test responses with many unknowns

US8898529B2 · kind B2 · utility

6Cited by

5References

5Claims

0Family size

Assignee

Universität Potsdam · DE

Inventors

Michael Goessel · Roter Dudel, DE
Michael Richter · Berlin, DE
Thomas Rabenalt · Unterhaching, DE

Key dates

Filing date	May 18, 2011
Grant date	Nov 25, 2014
Priority date	—
Expiry date	Oct 2, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318583
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A circuit arrangement for controlling the masking of test and diagnosis data with X values of an electronic circuit with N scan paths, wherein the test data are provided on insertion into the N scan paths by a decompressor with m inputs and N outputs (m<N) and wherein the masked test data are compacted by a compactor with N data inputs and n data outputs and m<N applies is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.