Patent · US Active

Measurement and testing system

US8902249B1 · kind B1 · utility

90Cited by
15References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2013
Grant dateDec 2, 2014
Priority date
Expiry dateSep 30, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T11/206
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is configured to generate one or more global reports utilizing the output of the measurement assembly, generate an information icon on the output screen of the visual display device, and assign the one or more global reports to the information icon. In other embodiments, the data acquisition and processing device is configured to automatically regulate the availability of tests based upon a requisite measurement assembly or a predetermined condition, and/or determine whether the output data from a plurality of measurement assemblies is to be combined so as to create a single virtual measurement assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.