Modular electronic testing apparatus and methods
US8902607B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 2011 |
| Grant date | Dec 2, 2014 |
| Priority date | — |
| Expiry date | May 30, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F1/181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A testing apparatus and method of extending the life of a testing apparatus may comprise a chassis including a case having a testing module receptacle receiving a plurality of testing modules comprising at least one processor module and a plurality of test modules, each having the same physical footprint, including respective racking mechanisms and inter-module interface connectors; and a backplane with connectors connecting with a respective inter-module connector, and bus-work interconnecting the respective modules through the inter-module interface connectors and the backplane connectors. The backplane may comprise a battery and display connector. The chassis may comprise a display mounting receptacle configured to receive a display unit having a display connector configured to interface with the backplane display connector. A battery receptacle may receive a battery unit, such as a rechargeable battery.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.