Monitoring of metrics to identify abnormalities in a large scale distributed computing environment
US8909768B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2011 |
| Grant date | Dec 9, 2014 |
| Priority date | — |
| Expiry date | May 21, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus, including computer program products, implementing and using techniques for finding application latency degradation causes in an application on a distributed computing system. Variables associated with the application and the computing system are identified, including variables that are candidates for being responsible for latency degradation. A total latency is divided into latency components, that each corresponds to an aspect of the total application latency. Each latency component is divided into study classes, that each includes a subset of the candidate variables. For each study class, combinations are generated for the subset of the variables; a latency distribution is determined for each variable combination; the determined latency distributions for the combinations are compared with corresponding latency benchmark values for the same combinations to determine whether a degradation in latency distributions has occurred for particular combinations among the one or more combinations, and a result is provided to a user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.