Patent · US Active

Self-test for yaw rate sensors

US8910518B2 · kind B2 · utility

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3References
12Claims
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Key dates

Filing dateApr 6, 2010
Grant dateDec 16, 2014
Priority date
Expiry dateApr 26, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/5726
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A yaw rate sensor (10) includes a movable mass structure (12) and a drive component (13) which is suitable for setting the movable mass structure (12) in motion (14), and an analysis component (15) which is suitable for detecting a response (40) of the movable mass structure (12) to a yaw rate (Ω). A method for functional testing of a yaw rate sensor (10) includes the following steps: driving a movable mass structure (12), feeding a test signal (42) into a quadrature control loop (44) at a feed point (48) of the quadrature control loop (44), feeding back a deflection (40) of the movable mass structure (12), detecting a measure of the feedback of the movable mass structure (12), and reading out the response signal (47) from the quadrature control loop (44). In the yaw rate sensor (10) and also in the method, the readout of the response signal (47) in relation to a processing direction (45) of the test signal (42) is provided between a feed point (48) for a test signal (42) and an actuator (38) for feeding back a deflection (40) of the movable mass structure (12).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.