Patent · US Active

Measurement of the positions of centres of curvature of optical surfaces of a multi-lens optical system

US8913234B2 · kind B2 · utility

1Cited by
4References
18Claims
0Family size

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Key dates

Filing dateNov 22, 2011
Grant dateDec 16, 2014
Priority date
Expiry dateDec 5, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/0221
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.