Latency measurement
US8914254B2 · kind B2 · utility
10Cited by
38References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2012 |
| Grant date | Dec 16, 2014 |
| Priority date | — |
| Expiry date | May 7, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/041
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.