Patent · US Active

Method for assessment of potential for development of dravet syndrome and use thereof

US8916743B2 · kind B2 · utility

2Cited by

1References

9Claims

0Family size

Assignee

NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY · JP

Inventors

Iori Ohmori · Okayama, JP
Mamoru Ouchida · Okayama, JP

Key dates

Filing date	Jun 23, 2014
Grant date	Dec 23, 2014
Priority date	—
Expiry date	Jun 23, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N2800/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided is a method of assessing a potential for development of Dravet syndrome with high accuracy, and use thereof. The method according to the present invention of assessing a potential for development of Dravet syndrome includes, with use of a sample taken from a subject, detecting whether or not a mutation is on α-subunit type 1 of voltage-gated sodium ion channel NaV1.1, and detecting whether or not a mutation is on α-subunit type 1 of voltage-gated calcium ion channel CaV2.1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.