Sacrificial waveguide test structures
US8916874B2 · kind B2 · utility
12Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2010 |
| Grant date | Dec 23, 2014 |
| Priority date | — |
| Expiry date | Mar 30, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2006/12166
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Sacrificial optical test structures are constructed upon a wafer of pre-cleaved optical chips for testing the optical functions of the pre-cleaved optical chips. The sacrificial optical structures are disabled upon the cleaving the optical chips from the wafer and the cleaved optical chips can be used for their desired end functions. The test structures may remain on the cleaved optical chips or they may be discarded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.