Systems and methods for media defect detection with pattern qualification
US8917468B1 · kind B1 · utility
1Cited by
42References
20Claims
0Family size
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Key dates
| Filing date | Jul 13, 2013 |
| Grant date | Dec 23, 2014 |
| Priority date | — |
| Expiry date | Jul 13, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/182
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus for detecting media flaws includes an envelope based media defect detector operable to identify a media defect based on an envelope of an input signal, a periodic pattern detector operable to determine whether the input signal comprises a data pattern, and a media flaw signal generation circuit operable to indicate a media defect when the envelope based media defect detector identifies the media defect and the periodic pattern detector determines that the input signal does not comprise the data pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.